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  1. Unified Methods for VLSI Simulation and Test Generation Unified Methods for VLSI Simulation and Test Generation

    Unified Methods for VLSI Simulation and Test Generation

    Vishwani D. Agrawal
    Springer US, Springer US
    30.06.1989

    Unified Methods for VLSI Simulation and Test Generation

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  2. Essentials of Electronic Testing for Digital, Memory and Mixed-Signal VLSI Circuits Essentials of Electronic Testing for Digital, Memory and Mixed-Signal VLSI Circuits

    Essentials of Electronic Testing for Digital, Memory and Mixed-Signal VLSI Circuits

    Vishwani Agrawal
    Springer US, Springer US
    30.11.2000

    The modern electronic testing has a forty year history. Test professionals hold some fairly large...

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    139,09 €
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  3. Essentials of Electronic Testing for Digital, Memory and Mixed-Signal VLSI Circuits Essentials of Electronic Testing for Digital, Memory and Mixed-Signal VLSI Circuits

    Essentials of Electronic Testing for Digital, Memory and Mixed-Signal VLSI Circuits

    Vishwani Agrawal
    Springer US, Springer US
    07.04.2013

    The modern electronic testing has a forty year history. Test professionals hold some fairly large...

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    139,09 €
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  4. Concurrent and Comparative Discrete Event Simulation Concurrent and Comparative Discrete Event Simulation

    Concurrent and Comparative Discrete Event Simulation

    Ernst G. Ulrich
    Springer US, Springer US
    31.12.1993

    Concurrent simulation is over twenty years old. During that pe riod it has been widely adopted fo...

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  5. Concurrent and Comparative Discrete Event Simulation Concurrent and Comparative Discrete Event Simulation

    Concurrent and Comparative Discrete Event Simulation

    Ernst G. Ulrich
    Springer US, Springer New York
    27.09.2012

    Concurrent simulation is over twenty years old. During that pe riod it has been widely adopted fo...

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    106,99 €
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  6. Neural Models and Algorithms for Digital Testing Neural Models and Algorithms for Digital Testing

    Neural Models and Algorithms for Digital Testing

    S. T. Chadradhar
    Springer US, Springer New York
    28.09.2012

    References . . . . . . . . . . . . . . . . . . . . . . . . . . . . 82 9 QUADRATIC 0-1 PROGRAMMING...

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    106,99 €
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  7. Neural Models and Algorithms for Digital Testing Neural Models and Algorithms for Digital Testing

    Neural Models and Algorithms for Digital Testing

    S T Chadradhar
    Springer Us
    30.06.1991

    References . . . . . . . . . . . . . . . . . . . . . . . . . . . . 82 9 QUADRATIC 0-1 PROGRAMMING...

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