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  1. Integrated Circuit Defect-Sensitivity: Theory and Computational Models Integrated Circuit Defect-Sensitivity: Theory and Computational Models

    Integrated Circuit Defect-Sensitivity: Theory and Computational Models

    José Pineda de Gyvez
    Springer US, Springer New York
    23.02.2014

    The history of this book begins way back in 1982. At that time a research proposal was filed with...

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    106,99 €
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  2. Defect-Oriented Testing for Nano-Metric CMOS VLSI Circuits Defect-Oriented Testing for Nano-Metric CMOS VLSI Circuits

    Defect-Oriented Testing for Nano-Metric CMOS VLSI Circuits

    José Pineda de Gyvez
    Springer US, Springer New York
    10.11.2010

    Defect-oriented testing methods have come a long way from a mere interesting academic exercise to...

    Taschenbuch
    213,99 €
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  3. Defect-Oriented Testing for Nano-Metric CMOS VLSI Circuits Defect-Oriented Testing for Nano-Metric CMOS VLSI Circuits

    Defect-Oriented Testing for Nano-Metric CMOS VLSI Circuits

    José Pineda de Gyvez
    Springer US, Springer New York
    21.06.2007

    Defect-oriented testing methods have come a long way from a mere interesting academic exercise to...

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    213,99 €
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  4. Low-Power High-Resolution Analog to Digital Converters Low-Power High-Resolution Analog to Digital Converters

    Low-Power High-Resolution Analog to Digital Converters

    Amir Zjajo
    Springer
    05.11.2010

    With the fast advancement of CMOS fabrication technology, more and more signal-processing functio...

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    Unser bisheriger Preis:ORGPRICE: 106,99 €

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  5. Low-Power High-Resolution Analog to Digital Converters Low-Power High-Resolution Analog to Digital Converters

    Low-Power High-Resolution Analog to Digital Converters

    José Pineda de Gyvez
    Springer Netherlands, Springer Netherlands
    23.08.2016

    With the fast advancement of CMOS fabrication technology, more and more signal-processing functio...

    Taschenbuch
    53,49 €
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  6. Integrated Circuit Defect-Sensitivity: Theory and Computational Models Integrated Circuit Defect-Sensitivity: Theory and Computational Models

    Integrated Circuit Defect-Sensitivity: Theory and Computational Models

    José Pineda de Gyvez
    Springer Us
    31.12.1992

    The history of this book begins way back in 1982. At that time a research proposal was filed with...

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    Unser bisheriger Preis:ORGPRICE: 108,50 €

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  7. Integrated Circuit Manufacturability Integrated Circuit Manufacturability

    Integrated Circuit Manufacturability

    José Pineda de Gyvez
    Wiley
    30.10.1998

    Electrical Engineering Integrated Circuit Manufacturability The Art of Process and Design Integra...

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    245,50 €
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