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  1. Beam Effects, Surface Topography, and Depth Profiling in Surface Analysis Beam Effects, Surface Topography, and Depth Profiling in Surface Analysis

    Beam Effects, Surface Topography, and Depth Profiling in Surface Analysis

    Alvin W. Czanderna
    Springer US, Springer US
    06.12.2010

    Many books are available that detail the basic principles of the different methods of surface cha...

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    160,49 €
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  2. Ion Spectroscopies for Surface Analysis Ion Spectroscopies for Surface Analysis

    Ion Spectroscopies for Surface Analysis

    Alvin W Czanderna
    Springer Us
    30.09.1991

    Determining the elemental composition of surfaces is an essential measurement in characterizing s...

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  3. Ion Spectroscopies for Surface Analysis Ion Spectroscopies for Surface Analysis

    Ion Spectroscopies for Surface Analysis

    David M. Hercules
    Springer US, Springer New York
    24.10.2012

    Determining the elemental composition of surfaces is an essential measurement in characterizing s...

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    53,49 €
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  4. Specimen Handling, Preparation, and Treatments in Surface Characterization Specimen Handling, Preparation, and Treatments in Surface Characterization

    Specimen Handling, Preparation, and Treatments in Surface Characterization

    Alvin W. Czanderna
    Springer US, Springer US
    31.01.1999

    With the development in the 1960s of ultrahigh vacuum equipment and techniques and electron, X-ra...

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  5. Specimen Handling, Preparation, and Treatments in Surface Characterization Specimen Handling, Preparation, and Treatments in Surface Characterization

    Specimen Handling, Preparation, and Treatments in Surface Characterization

    Alvin W. Czanderna
    Springer US, Springer US
    26.04.2013

    With the development in the 1960s of ultrahigh vacuum equipment and techniques and electron, X-ra...

    Taschenbuch
    160,49 €
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  6. Beam Effects, Surface Topography, and Depth Profiling in Surface Analysis Beam Effects, Surface Topography, and Depth Profiling in Surface Analysis

    Beam Effects, Surface Topography, and Depth Profiling in Surface Analysis

    Alvin W Czanderna
    Springer Us
    31.10.1998

    Many books are available that detail the basic principles of the different methods of surface cha...

    Gebunden

    Unser bisheriger Preis:ORGPRICE: 162,50 €

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    Besorgungstitel - wird vorgemerkt
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